Pages 1105–1109 from the book:

Near Infrared Spectroscopy: Proceedings of the 11th International Conference

ISBN: 978-1-906715-23-6

Development of a NIR device for measuring varnish thickness on-line

Francisco Manero, Javier Anduaga, Kepa Mayora, Izaskun Garmendia, Pentti Niemelä, Eero Hietala and Jouni Tornberg

Download  
Buy Book