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ToF-SIMS: Materials Analysis by Mass Spectrometry 2nd Edition

ISBN: 978-1-906715-18-2

Chapter 12. Molecular depth profiling

Alex Shard, Ian Gilmore and Andreas Wucher

Chapter 26. Photographic and digital graphic materials

Luc Van Vaeck, Yannick Vercammen, Jens Lenaerts, Roel De Mondt, Jaymes Van Luppen and Frank Vangaever