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ToF-SIMS: Materials Analysis by Mass Spectrometry 2<sup>nd</sup> Edition

ISBN: 978-1-906715-18-2

Chapter 12. Molecular depth profiling

Alex Shard, Ian Gilmore and Andreas Wucher

Chapter 22. Medical and biological applications of cluster ToF-SIMS

David Touboul, Olivier Lapr&#x00E9;vote and Alain Brunelle

Chapter 26. Photographic and digital graphic materials

Luc Van Vaeck, Yannick Vercammen, Jens Lenaerts, Roel De Mondt, Jaymes Van Luppen and Frank Vangaever