ToF-SIMS: Surface Analysis by Mass Spectrometry 2nd Edition CoverToF-SIMS: Surface Analysis by Mass Spectrometry 2nd Edition
Edited by
John C. Vickerman and David Briggs

The Second Edition of this well-received book is available.

In the decade following the first edition of this book, ToF-SIMS has been transformed by the adoption of heavy polyatomic or cluster primary ion sources. Lower damage rates and higher yields of analytically useful ­secondary ions have benefited all areas of application, especially in medical science, but the ability to perform depth profiling of organics has opened up entirely new possibilities. These and other advances in instrumentation and data handling/interpretation are all reflected in this completely revised edition.

ISBN: 978-1-906715-17-5
vii + 732 pp.
Publication: July 2013
Price: £180


Prologue: ToF-SIMS—An evolving mass spectrometry of materials
John C. Vickerman

The history of Static SIMS—A personal perspective
Alfred Benninghoven

Status of cascade theory
Herbert M. Urbassek

Fundamentals of organic SIMS: insights from experiments and models
Arnaud Delcorte

Molecular speciation analysis of inorganic compounds
Luc Van Vaeck

Molecular dynamics simulations, the theoretical partner to dynamic cluster SIMS experiments
Barbara J. Garrison and Zbigniew Postawa

Birgit Hagenhoff

Laser post-ionisation—fundamentals
Andreas Wucher

Time-of-flight mass analysers
Bruno W. Schueler

Analysis beams used in ToF-SIMS
Roland Hill

Cluster and polyatomic primary ion beams
John S. Fletcher and Christopher Szakal

Molecular depth profiling
Alex Shard and Ian Gilmore

Role of operating conditions in ToF-SIMS
Ian Gilmore

Laser post-ionisation for elemental and molecular surface analysis
Nicholas P. Lockyer

Sample handling for ToF-SIMS
Fraser Reich

Qualitative interpretation of spectra
David Briggs and Ian W. Fletcher

Multivariate analysis of SIMS spectra
Alex Henderson

ToF-SIMS image analysis
Bonnie J. Tyler

Characterisation of polymeric materials
Lu-Tao Weng and Chi-Ming Chan

Functional modification of surfaces using self-assembled monlayers
Amy V. Walker

Application of SIMS to study of biological systems
Alan M Piwowar and Nicholas Winograd

Medical and biological applications of cluster beam-ToF-SIMS
David Touboul, Olivier Laprévote and Alain Brunelle

Depth profiling of inorganic materials
Ewald Niehuis and Thomas Grehl

Depth profiling in organic electronics
Ewald Niehuis

Contamination monitoring and failure analysis
Arwa Ginwalla, Thomas F. Fister and Ian A. Mowat

Photographic and digital graphic materials
Luc Van Vaeck, Yannick Vercammen, Jens Lenaerts, Roel De Mondt, Jaymes Van Luppen and Frank Vangaever

Applications of ToF-SIMS in cosmochemistry
Thomas Stephan and Ian C. Lyon