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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

ISBN: 978-1-901019-04-9

Perspectives on XPS and AES

David Briggs and John T. Grant

Beam Effects During AES and XPS Analysis

Don R. Bear, Dan J. Gaspar, Mark H. Engelhard and A.Scott Lea

Sputter Depth Profiling in AES and XPS

Thomas Wagner, Jiang Y. Wang and Siegfried Hofmann

XPS Imaging

Kateryna Artyushkova and Julia E. Fulghum

Comparing Beam Damage Rates Using Susceptibility Tables

D.R. Baer, M.H Engelhard, A.S. Lea and D.J. Gaspar