<<< All E-Books

Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

ISBN: 978-1-901019-04-9

Beam Effects During AES and XPS Analysis

Don R. Bear, Dan J. Gaspar, Mark H. Engelhard and A.Scott Lea

Sputter Depth Profiling in AES and XPS

Thomas Wagner, Jiang Y. Wang and Siegfried Hofmann

XPS Imaging

Kateryna Artyushkova and Julia E. Fulghum